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~Metrological Test Station for CCD Arrays~


Differntial measurement system for in-cryostat 9-CCD flatness measurement. Uses two Keyence absolute-distance laser triangulation sensors to compare the surface height of the surface under test (CCD array imaging surface) to an optical reference flat. Concept: Peter Takacs.



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Diagram of test station.




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Another view showing Test/Commissioning Cryostat and utility cart being lowered onto stand.


optical reference stage
Detail of kinematic adjustment mechanism on optical reference stage.

In operation with Jadzia.


Another view.